Non-Destructive Testing

Scanning acoustic microscopy, warpage and TDM measurement, and non-destructive X-ray — seeing inside without opening up.

3 product lines

Scanning Acoustic Microscope(SAM)

3 options

ManufacturerOKOS VUE 400-P Full featured

VUE 400-P imaging power surpasses modern standards delivering premium FA lab features to semiconductor fabrication facilities with application specific transducers

ManufacturerOKOS VUE 250-P Compact

ManufacturerMulti Axis Industrial UT NDT Scanner

ManufacturerXRH Series

Other categoriesAll products

Specification is the part that decides whether equipment meets its numbers. Tell us the process and the constraint.

Scanning acoustic microscopy, warpage and TDM measurement, and non-destructive X-ray — seeing inside without opening up.

3 product lines

3 options

ManufacturerOKOS VUE 400-P Full featured

VUE 400-P imaging power surpasses modern standards delivering premium FA lab features to semiconductor fabrication facilities with application specific transducers

ManufacturerOKOS VUE 250-P Compact